Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="normal">Cu</mml:mi><mml:mo>/</mml:mo><mml:mi mathvariant="normal">NiFe</mml:mi></mml:math>multilayers

Luo, Guangming; H., Z.; Hase, Thomas P. A.; Fulthorpe, B. D.; Tanner, B. K.; Marrows, C. H.; Hickey, B. J.

doi:10.1103/physrevb.64.245404

Cited by 25 publications

(16 citation statements)

References 15 publications

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“…Such an asymmetry in the width of intermixing in sputtered layers of aluminium on transition metals and vice versa was found by Buchanan et al [7]. A similar asymmetry in interface width was found by Bigault et al [8] in Ni/Au multilayers and Luo et al [9] in NiFe/Cu multilayers, both using anomalous X-ray scattering. Bigault et al suggested that that dynamical (out-of-equilibrium) segregation driven by the growth front probably determines the intermixing length and gives rise to the asymmetry.…”

Section: Discussionsupporting

confidence: 58%

Layer and Interface Structure of CoFe/Ru Multilayers

et al. 2007

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Grazing incidence X-ray scattering measurements have been performed to probe the structure of CoFe/Ru layers and their interfaces. It was found that the interface width increased approximately linearly with the layer number from the substrate in a multilayer and that a substantial asymmetry existed between the width of CoFe/Ru and Ru/CoFe interfaces. By co--minimizing both the specular and diffuse scatter with that simulated from a model structure, the topological roughness amplitude was determined to be comparable to the intermixing interface width.

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Section: Discussionsupporting

confidence: 58%

Layer and Interface Structure of CoFe/Ru Multilayers

et al. 2007

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“…The X-ray reflection anomalous fine structure (RAFS) technique [8,9] which combines the X-ray anomalous scattering and the X-ray specular reflectivity is sensitive to the elemental distributions at the interfaces. The structure factor of a multilayer can be written as F ¼ĩ r i Iexp À ik z Iz i ð Þ , where r i is the reflection coefficient at the ith interface, k z the wave vector, and Z i the interface position normal to the surface.…”

Section: Resultsmentioning

confidence: 99%

“…It would result in very low contrast of The purpose of this paper is to present a direct measurement of spatial distributions of Fe, Co and Cu atoms at the interface of Co 90 Fe 10 /Cu multilayers. To achieve this objective the X-ray anomalous scattering technique [8][9][10] is used. It exploits the high sensitivity of the diffracted intensity in the energy and momentum transfer vector.…”

Section: Introductionmentioning

confidence: 99%

Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

Dai

Cai

et al. 2006

Thin Solid Films

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“…to correct the data for self absorption when measuring bulk samples (see for instance [18,19]). Therefore the method is definitely well suited for studying thin films or heterostructures [5,[20][21][22][23][24][25]. Also, in some cases, multiple diffraction inside the sample can be a source of signal distorsion.…”

Section: Introductionmentioning

confidence: 99%

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

Favre‐Nicolin

Proietti

Leclère

et al. 2012

Eur. Phys. J. Spec. Top.

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Abstract. The aim of this paper is to illustrate the use of MultiWavelength Anomalous Diffraction (MAD) and Diffraction Anomalous Fine Structure (DAFS) spectroscopy for the study of structural properties of semiconductor nanostructures. We give a brief introduction on the basic principles of these techniques providing a detailed bibliography. Then we focus on the data reduction and analysis and we give specific examples of their application on three different kinds of semiconductor nanostructures: Ge/Si nanoislands, AlN capped GaN/AlN Quantum Dots and AlGaN/AlN Nanowires. We show that the combination of MAD and DAFS is a very powerful tool to solve the structural problem of these materials of high technological impact. In particular, the effects of composition and strain on diffraction are disentangled and composition can be determined in a reliable way, even at the interface between nanostructure and substrate. We show the great possibilities of this method and give the reader the basic tools to undertake its use.

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Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealingCu/NiFemultilayers

Cited by 25 publications

References 15 publications

Layer and Interface Structure of CoFe/Ru Multilayers

Layer and Interface Structure of CoFe/Ru Multilayers

Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

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