2011 Design, Automation &Amp; Test in Europe 2011
DOI: 10.1109/date.2011.5763031
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Variability-aware duty cycle scheduling in long running embedded sensing systems

Abstract: Instance and temperature-dependent leakage power variability is already a significant issue in contemporary embedded processors, and one which is expected to increase in importance with scaling of semiconductor technology. We measure and characterize this leakage power variability in current microprocessors, and show that variability aware duty cycle scheduling produces 7.1x improvement in sensing quality for a desired lifetime. In contrast, pessimistic estimations of power consumption leave 61% of the energy … Show more

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Cited by 11 publications
(6 citation statements)
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“…Most efforts dealing with variation have focused on mitigating and exploiting it in processors [6], [7], [11], [12] or in on-chip memory [13], [14], [15], [16], [17]. Fewer papers have looked at variability in off-chip, DRAM-based memory subsystems.…”
Section: Related Workmentioning
confidence: 99%
“…Most efforts dealing with variation have focused on mitigating and exploiting it in processors [6], [7], [11], [12] or in on-chip memory [13], [14], [15], [16], [17]. Fewer papers have looked at variability in off-chip, DRAM-based memory subsystems.…”
Section: Related Workmentioning
confidence: 99%
“…3, where power (write, read, and idle) variability is shown across various categories (e.g., across all nineteen 1 GB DIMMs tested, across same exact parts, etc.) tested at 30 C. As a result, just like [62,51,46] exploited variability in processor power consumption, our goal is to adapt our memory management layer and opportunistically take advantage of these variations to reduce power consumption.…”
Section: Variations In the Memory Subsystemmentioning
confidence: 99%
“…The resulting Underdesigned and Opportunistic (UNO) computing machines can be classified along following two axes: (a) Type of Underdesign: use parametrically under-provisioned circuits (e.g., voltage overscaling as in [4], [5]) or be implemented with explicitly altered functional description (e.g., [3], [6]); and (b) Type of Operation: rely upon application's level of tolerance to limited errors (as in [7], [8]) to ensure continued operations. By contrast, error-free UNO machines correct all errors (e.g., [4]) or rely on hardware to correct-operation limits (e.g., [1], [2]). …”
Section: Figure 1 Itrs Projections Of Variabilitymentioning
confidence: 99%