Validation of three‐dimensional surface characterising methods: Scanning electron microscopy and confocal laser scanning microscopy

Abstract

Summary: Surface characteristics of enosseous titanium implants have been known to influence the quality of osseointegration. Parameters recommended for metrical analysis should be supplemented by a topographical description. In this study, R a values obtained by established tactile and optical profilometric methods are correlated with those obtained by stereo scanning electron microscopy (SEM) and confocal laser scanning microscopy (CLSM). As test specimens, standardised CVD diamond-coated titanium alloys with different microwave coating power ranging from 2000 to 3000 W were used. A non-CVDcoated corund grit-blasted specimen (NC) was used as reference. After coating with a CVD, power of 2000 W R a ranges from 4.33 to 5.69 µm depending on the method used. With increasing power of the coating process, the amplitude of the surface roughness is significantly increased to 4.53 to 6.89 µm. R a values of the same sample obtained by different methods are also significantly different (p=0.001). Compared with the established methods of tactile and optical profilometry, SEM and CLSM offer valid data on the surface roughness accompanied by a topographical imaging. In future studies, the underlying method should be specified to interpret roughness values correctly, as not every method is suitable for each specimen and values obtained by different methods vary extremely.

Effects of sandblasting before orthophosphoric acid etching on lingual enamel: In-vitro roughness assessment

“…29 The conventional contact profilometer is a linear measurement tool that has often been used to measure roughness, but it produces lower Ra values than does the optical profilometer because of the limitations of the spatial dimensions of its tip in detecting microcracks. 34 Moreover, the conventional profilometer may damage hard dental tissues because of its contact with the specimen. Confocal laser microscopes are optical scanners that simultaneously provide images and profile analysis of a selected microarea with no contact with the specimen, but at a high spatial resolution.…”

Two‐ and three‐dimensional profilometer assessments to determine titanium roughness

“…Although it is difficult to provide a definite explanation for this discrepancy, this study observed a significant difference in Ra values according to the method used and the surface studied. Al-Nawas et al Although the mean values of the different surfaces were very close, the differences can be explained by the spatial dimension of the stylus limiting the detection of microgrooves (Al-Nawas et al 2001). Roughness may be measured using contact or noncontact methods.…”

“…These methods include scanning electron microscopy (SEM), confocal laser scanning microscopy, tactile microscopy, optical profilometry, scanning force microscopy, contact scanning instruments and noncontact laser profilometry (Al-Nawas et al 2001;Bigerelle et al 2002;Canabarro et al 2008).…”

Implantateinheilung

“…Die Abbildungen 4a bis 4c zeigen exemplarisch unterschiedliche Modifikationen der Titanoberflächen kommerzieller, dentaler Implantate (rasterelektronenmikroskopische Aufnahmen, 1500-fache Vergrößerung). Etablierte und von unserem Zentrum routinemä-ßig durchgeführte Untersuchungsmethoden zur Charakterisierung von Implantatoberflächen sind neben Bestimmungen der Implantatoberflächentopographie mit Erhebung von Rauhigkeitsparametern [2,3] …”