2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe) 2020
DOI: 10.23919/epe20ecceeurope43536.2020.9215595
|View full text |Cite
|
Sign up to set email alerts
|

Validation of Thermal Stress Modeling in PV Inverters under Mission Profile Operation

Abstract: This paper quantifies the accuracy of thermal stress modeling in PV inverters under real mission profile operation. The estimated thermal stress profiles obtained from a lumped thermal network under one-day mission profiles are compared with the experimental measurement. According to the results, the average estimation error is well below 1.5 % even under highly dynamics mission profile conditions.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 10 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?