Validation of inductance measurements at NMi VSL

Dierikx, Erik; Beek, J.H.N. van der

doi:10.1109/cpem.2008.4574791

2008 Conference on Precision Electromagnetic Measurements Digest 2008

DOI: 10.1109/cpem.2008.4574791

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Validation of inductance measurements at NMi VSL

Erik Dierikx

J.H.N. van der Beek

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Validation of inductance measurements at NMi VSL

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