Validating the Reliability Simulation Using Bohlamp Circuit with Accelerated Life Test Method

Abstract

Learning media is very importance tools to achieved the learning outcome like capable to design reliability engineering system (RES). The students should be understanding with basic theory of reliability and also have technical skill based on need analysis. Unfortunately, the RES learning media are still not available specially to implement of several type of reliability system. Objective of the study is introducing reliability device model simulation with choice option series, parallel and combine series-parallel system. Method of the study are using accelerated life testing method (ALT) which has been analyzed with statistical method to estimate life-time at normal condition. Validating value of each reliability system are have similarity between experimental test (Re) and theoretical (Rt) i.e.: series (Rt=0.329; Re=0.359); parallel (Rt=0.976; Re=0.972.), and combined of series-parallel (Rt=0. 651; Re=0.686). The conclusion is the parallel have high-fidelity on application of reliability simulation with error 0.000409.