2014
DOI: 10.1007/s10967-014-3313-9
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Validating mass spectrometry measurements of nuclear materials via a non-contact volume analysis method of ion sputter craters

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Cited by 2 publications
(1 citation statement)
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“…Although we did not measure the sample utilization efficiency using the samples investigated here, prior studies have measured EUV TOF’s efficiency to be 0.014% for 238 U . Small geometry SIMS achieves ∼2 × 10 –6 % efficiency, while LG SIMS achieves >1% efficiency for U using an O – primary ion beam. We expect NanoSIMS to have an efficiency that is around the LG-SIMS value because of the similar transmission of both instruments .…”
Section: Resultsmentioning
confidence: 94%
“…Although we did not measure the sample utilization efficiency using the samples investigated here, prior studies have measured EUV TOF’s efficiency to be 0.014% for 238 U . Small geometry SIMS achieves ∼2 × 10 –6 % efficiency, while LG SIMS achieves >1% efficiency for U using an O – primary ion beam. We expect NanoSIMS to have an efficiency that is around the LG-SIMS value because of the similar transmission of both instruments .…”
Section: Resultsmentioning
confidence: 94%