“…Various metal/carbon systems, for example MC (M: Zr, Hf, V, Nb, Ta) 7, TiC 7–9, SiC 10, Ti 4 SiC 3 11, and UC 12 have been analyzed by combining soft X‐ray spectroscopy and/or the DV‐Xα method. However, the previously reported X‐ray spectral profiles occasionally appear to have a lower resolution, and the spectral simulations using the DV‐Xα method often seem to be insufficient for the high‐resolution spectral profiles.…”