Vacuum interrupter, high reliability component of distribution switches, circuit breakers and contactors

Slade, Paul G.; Li, Wangpei; Mayo, Stephen L.; Smith, Richard C.; Taylor, E.

doi:10.1631/jzus.2007.a0335

Cited by 17 publications

(8 citation statements)

References 11 publications

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“…Modes with a faster leak rate or triggered early in the VI life would fall under the "infant mortality" potential failure modes, which are discussed and characterized in [5,11].…”

Section: Failure Modes For Vi'smentioning

confidence: 99%

“…As part of the review process, the internal pressure (as well as other parameters) was measured, typically 2-12 weeks after testing. A power frequency withstand test   at 80% the rated value was also applied to verify that the vacuum level was < 10  ℎ [11].…”

Section: Pressure After Testingmentioning

confidence: 99%

“…Using the formulas for a cylindrical leak path [12] with a path length 2mm for 10   of N 2 at 300° K on one side and vacuum on the other side, the diameter of such a leak would be 25 nm for a leak rate of 10   •    . Leaks with this rate cannot be detected by standard leak detection methods, and are blocked from leaking by atmospheric gases [11,13]. For VI's, these leaks can be detected by measuring a pressure  10  ℎ after exposure to a noble or other non-getterable gas.…”

mentioning

confidence: 99%

“…Without an inspection point or evidence that the VI withstood an operation requiring a high vacuum level, it would be difficult or impossible to determine when the vacuum degraded in the VI. This would leave a pressure increase during the first months or few years of a VI's life [11] as the most likely timing for the failure.…”

mentioning

confidence: 99%

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Long-term vacuum integrity of vacuum interrupters

Taylor

Lawall

Gentsch³

2014

2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)

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Vacuum interrupters (VI's) are the primary switching technology for medium voltage (1-52kV) electrical power systems. The extensive field service of VI's is now raising interest in determining the end of life for these devices, with the primary concern being the loss of vacuum. The manufacturing method of the VI's can affect the calculated long-term life. In particular, there are three main design groups to evaluate. The key differences between these three groups are the processing temperature and permeability of the housing to hydrogen and helium. Many potential failure modes occur independently of the field application or lack thereof, and can be evaluated based data from VI's in long-term storage or after operations, such as seen during development and certification testing. The field returns history from VI manufacturers also provided critical information on the VI lifetime. These various factors can be combined to identify risk factors that could alter the estimated life.I.

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“…Modes with a faster leak rate or triggered early in the VI life would fall under the "infant mortality" potential failure modes, which are discussed and characterized in [5,11].…”

Section: Failure Modes For Vi'smentioning

confidence: 99%

Section: Pressure After Testingmentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

See 2 more Smart Citations

Long-term vacuum integrity of vacuum interrupters

Taylor

Lawall

Gentsch³

2014

2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)

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“…However, a control circuit, with usually some 1,000FIT, is still needed and might ignite the crowbar on unwanted occasions. If a parallel system is still wanted then vacuum technology seems to be the most reliable solution, besides vacuum circuit breakers seem to be fully controllable [14].…”

Section: Reliability Of Bypass Systemsmentioning

confidence: 99%

Impact of modularity and redundancy in optimising the reliability of power systems that include a large number of power converters

Siemaszko

Pittet

2011

Microelectronics Reliability

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CERN is working on a new particle accelerator that will require a very large number of power converters. In that view, the reliability of the whole powering will be a major issue. The use of a redundancy and modularity may help increasing the overall machine availability. However, the reliability of the redundancy system must be high enough to add a significant improvement when compared to simple module systems. This paper suggests a comparative study of several modular and redundant configurations for optimising power converters reliability and draws some conclusion from what has been achieved in the LHC previous experience.Presented at Presented at the 15th International Conference on RF Superconductivity, SRF2011 25-29 July 2011, Chicago, USA Geneva, Switzerland CERN-ATS-2012-014January 2012 AbstractCERN is working on a new particle accelerators that will require a very large number of power converters. In that view, the reliability of the whole powering will be a major issue. The use of a redundancy and modularity may help increasing the overall machine availability. However, the reliability of the redundancy system must be high enough to add a significant improvement when compared to simple module systems. This paper suggests a comparative study of several modular and redundant configurations for optimising power converters reliability and draws some conclusion from what has been achieved in the LHC previous experience.

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Contact resistance and arc erosion of tungsten-copper contacts in direct currents

Xie

et al. 2017

J. Wuhan Univ. Technol.-Mat. Sci. Edit.

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Vacuum interrupter, high reliability component of distribution switches, circuit breakers and contactors

Cited by 17 publications

References 11 publications

Long-term vacuum integrity of vacuum interrupters

Long-term vacuum integrity of vacuum interrupters

Impact of modularity and redundancy in optimising the reliability of power systems that include a large number of power converters

Contact resistance and arc erosion of tungsten-copper contacts in direct currents

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