V&lt;inf&gt;th&lt;/inf&gt; is dead - long live the threshold voltage

Hillebrand, Theodor; Taddiken, Maike; Tscherkaschin, Konstantin; Paul, Steffen; Peters-Drolshagen, Dagmar

doi:10.1109/iirw.2016.7904902

2016 IEEE International Integrated Reliability Workshop (IIRW) 2016

DOI: 10.1109/iirw.2016.7904902

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V<inf>th</inf> is dead - long live the threshold voltage

Theodor Hillebrand

Maike Taddiken

Konstantin Tscherkaschin

et al.

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V<inf>th</inf> is dead - long live the threshold voltage

Cited by 1 publication

References 6 publications

A New Approach to Threshold Voltage Measurements of Transistors

A New Approach to Threshold Voltage Measurements of Transistors

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