2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH
DOI: 10.1109/isemc.2001.950538
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UWB and EMP susceptibility of modern electronics

Abstract: The susceptibility of different types of single microcontrollers and complex microprocessorboards to unipolar fast rise time pulses is determined. Rise times down to 100 ps and field amplitudes up to 50 kV/m have been applied to the devices.

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Cited by 38 publications
(10 citation statements)
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“…As the high-power electromagnetic pulse may bring disturb to electronic systems or integrated circuit, cause some dysfunctions even damages to them [1][2][3]. Researches aimed at the damage threshold of electromagnetic pulse have become one of research hotspots in the world presently [4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%
“…As the high-power electromagnetic pulse may bring disturb to electronic systems or integrated circuit, cause some dysfunctions even damages to them [1][2][3]. Researches aimed at the damage threshold of electromagnetic pulse have become one of research hotspots in the world presently [4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%
“…Electromagnetic pulse (EMP) produced by nuclear explosion, lighting and electrostatic discharge can disrupt or damage critical electronic facilities over an very large area, so it usually act as a killer of unprotected electrical and electronic equipment [1]. In order to research the action mechanism of the EMP and the characteristic of the transient electromagnetic field, the time domain measurement theory and technologies of transient electromagnetic field has become one of the focal point in the region of EMP attack and protection.…”
Section: Introductionmentioning
confidence: 99%
“…Because of steep rising front edge, short duration time and wide spectrum, transient electromagnetic pulse (EMP) can easily couple into the internal structure of missiles or aircrafts through apertures and slots [1]. Lots of essential openings in the shell of targets, such as hot-radiating windows and data openings, provide the coupling path for transient EMP.…”
Section: Introductionmentioning
confidence: 99%