2011
DOI: 10.1016/j.apsusc.2010.11.021
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UV laser-induced high resolution cleaving of Si wafers for micro–nano devices and polymeric waveguide characterization

Abstract: Keywords:Laser cleaving Micro-nano photonic chips Polymeric waveguides Silicon fractureIn this work we propose a method for cleaving silicon-based photonic chips by using a laser based micromachining system, consisting of a ND:YV0 4 laser emitting at 355 nm in nanosecond pulse regime and a micropositioning system. The laser makes grooved marks placed at the desired locations and directions where cleaves have to be initiated, and after several processing steps, a crack appears and propagate along the crystallog… Show more

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Cited by 3 publications
(3 citation statements)
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References 17 publications
(29 reference statements)
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“…In contrast to traditional mechanical cleaving of diamond, LNC provides the opportunity for precise control of the cleave propagation by tuning the scan speed of the laser. Similar to what has been done with silicon stealth dicing [49], where the laser power and stage translation speed have been tuned to achieve Wallner-line-free cleaves [50], further analysis of the mechanisms involved in LNC should allow for drastic reduction of the Wallner lines that form during crack propagation [39]. Furthermore, by simultaneously scanning the laser position and focus, it may be possible to propagate cleaves along {100} or {110} planes in SCD.…”
Section: Discussionmentioning
confidence: 99%
“…In contrast to traditional mechanical cleaving of diamond, LNC provides the opportunity for precise control of the cleave propagation by tuning the scan speed of the laser. Similar to what has been done with silicon stealth dicing [49], where the laser power and stage translation speed have been tuned to achieve Wallner-line-free cleaves [50], further analysis of the mechanisms involved in LNC should allow for drastic reduction of the Wallner lines that form during crack propagation [39]. Furthermore, by simultaneously scanning the laser position and focus, it may be possible to propagate cleaves along {100} or {110} planes in SCD.…”
Section: Discussionmentioning
confidence: 99%
“…Semiconductor fabrication plants and scientists always use wafers to manufacture semiconductor devices. [1][2][3] However, postprocess methods for organic photoelectric materials are still rare. This defect limits the material for applications.…”
mentioning
confidence: 99%
“…Casquel and Juan José García-Ballesteros and was applied mainly to the precise dicing of photonic devices (Casquel et al 2011). Amount of generated debris depends on the technique used, but generally these thermal processes generate a low amount of debris compared with the other ones.…”
Section: Wafer Dicingmentioning
confidence: 99%