Abstract:High mobility channel materials such as Si1-xGex (x = 0.1-0.5) are important to achieve performance targets for FinFET devices at dimensions scaled beyond 14nm. Previously, flowable (FCVD) SiO2 deposition processes have been developed to achieve adequate fill for Shallow Trench Isolation in FinFET structures. However, the thermal budget for curing FCVD oxide with SiGe fins must be limited to avoid out-diffusion of Ge. This restricts the processing options for achieving a robust material which is compatible wit… Show more
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