1982
DOI: 10.1180/claymin.1982.017.3.05
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Utilisation du rayonnement synchrotron en diffusion aux petits angles pour l'etude du gonflement des smectites: II. Etude de différents systÈmes eau-smectites en fonction de la température

Abstract: RI~SUMI~: Le m6canisme de dispersion dans l'eau d'une smectite a &6 &udi~ en fonction de 2 param&res: la nature du cation interlamellaire, la nature du feuillet de smectite. Pour cela, on a observ6 l'~volution du diagramme de diffusion aux petits angles en fonction de la temp6rature (entre --15~ et la temp6rature ambiante) d'une s~rie de dispersions contenant 20 g d'argile dans 100 g d'eau. La m&hode d'interpr&ation des diagrammes est bas6e sur la comparaison entre courbes exp6rimentales et calcul6es. Les rbsu… Show more

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Cited by 36 publications
(17 citation statements)
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“…The effect of the latter parameter has also been shown by Moore and Hower (1986). By modeling low-angle X-ray scattering of smectite gels, Pons et al (1981Pons et al ( , 1982 demonstrated the coexistence of various hydration states in the same sample. This may be an additional simulation hypothesis to be tested.…”
Section: Discussionmentioning
confidence: 81%
See 1 more Smart Citation
“…The effect of the latter parameter has also been shown by Moore and Hower (1986). By modeling low-angle X-ray scattering of smectite gels, Pons et al (1981Pons et al ( , 1982 demonstrated the coexistence of various hydration states in the same sample. This may be an additional simulation hypothesis to be tested.…”
Section: Discussionmentioning
confidence: 81%
“…Other methods of interpretation require measurements on higher-angle peaks (Srodon, 1980(Srodon, , 1981(Srodon, , 1984, and they are difficult to perform routinely because of the low intensity of these peaks and frequent overlap with other phases. The trial and error crystallographic simulation approach, widely used on monophasic samples (Tchoubar, 1980;Besson, 1980;Pons et al, 1981Pons et al, , 1982Ben Hadj-Amara et al, 1987) as well as on pure mixed-layer minerals (Sakharov and Drits, 1973;Reynolds, 1980;Srodon, 1980 and1984;Inoue et al, 1990;Drits et al, 1990), may also be used to model complex polyphasic XRD profiles (e.g., Lanson and Besson, 1992). However, this method is so time-consuming that its routine application on dozens of samples is unrealistic.…”
Section: Introductionmentioning
confidence: 99%
“…Under stress, the uptake or loss of water by the clay occurs with a concomitant structural reorganization of the material at different scales (Millot 1964;Concaret 1967;Henin 1971;Monnier et al 1973;Pedro 1976;Pons et al 1981Pons et al , 1982Robertson et al 1982;Tessier 1984; Ben Rhaiem 1983; Ben Rhaiem et al 1986;Touret et al 1990). In order to characterize the structural changes of these clays under different stresses, it was necessary to get a continuous picture of the organization levels from the structural ordering of the layer stacks up to the size of the first aggregates (Pons et at.…”
Section: Introductionmentioning
confidence: 99%
“…A more realistic structural model includes the variation from the average structure and the presence of defects that affect their reactivity and growth. The presence of incomplete layers within the stacking sequence (Pevear et al 1991;Tsipursky et al 1992), the coexistence of various hydration states (Ports et al 1981 and1982) or the scatter of elementary layer thicknesses around a mean value (Kodama et al 1971;Srodofi 1980;Sato et al 1992) are some of the defects and strains that can modify XRD line profiles.…”
Section: Discussionmentioning
confidence: 99%