2021
DOI: 10.3390/s21041269
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Using Soft Sensors as a Basis of an Innovative Architecture for Operation Planning and Quality Evaluation in Agricultural Sprayers

Abstract: One of the major problems facing humanity in the coming decades is the production of food on a large scale. The production of large quantities of food must be conducted in a sustainable and responsible manner for nature and humans. In this sense, the appropriate application of agricultural pesticides plays a fundamental role since pesticide application in a qualified manner reduces human and environmental risks as well as the costs of food production. Evaluation of the quality of application using sprayers is … Show more

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Cited by 5 publications
(2 citation statements)
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References 23 publications
(32 reference statements)
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“…The former is commonly based on the first principle model but hard to be extensively used on account of its complicated processes and unquantifiable parametric relationships. The most popular modeling techniques for data-driven soft sensors include principal component regression (PCR) [12,13], partial least squares (PLS) [14,15], artificial neural networks (ANN) [16,17] and support vector machines (SVM) [18,19]. Wang et al [20] integrated random forest with Bayesian optimization to predict and maintain product quality and validated model superiorities through semiconductor production line data.…”
Section: Quality Control In Process Industriesmentioning
confidence: 99%
See 1 more Smart Citation
“…The former is commonly based on the first principle model but hard to be extensively used on account of its complicated processes and unquantifiable parametric relationships. The most popular modeling techniques for data-driven soft sensors include principal component regression (PCR) [12,13], partial least squares (PLS) [14,15], artificial neural networks (ANN) [16,17] and support vector machines (SVM) [18,19]. Wang et al [20] integrated random forest with Bayesian optimization to predict and maintain product quality and validated model superiorities through semiconductor production line data.…”
Section: Quality Control In Process Industriesmentioning
confidence: 99%
“…] + 𝑃 𝑚𝑚𝑖𝑛 (13) where 𝑃 𝑚 , 𝑃 𝑚𝑚𝑎𝑥 , 𝑃 𝑚𝑚𝑖𝑛 are mutation rate, maximum mutation rate and minimum mutation rate, respectively; 𝑓 𝑚 is fitness of individual to mutate; 𝛼 2 is a height parameter of the curve. The adaptive mutation rate curve is shown in Fig.…”
Section: Fig 8 Improved Ga Structurementioning
confidence: 99%