2000
DOI: 10.1007/s11837-000-0126-9
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Using quantitative electron microscopy for process mineralogy applications

Abstract: Figure 1. A schematic of the basis of stereological error, with sections (gray lines) through liberated and composite particles of varying texture and the corresponding magnitude of bias.

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Cited by 309 publications
(157 citation statements)
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“…This still faces major limitations but can be addressed using, or combining, energy dispersive X-ray spectra (Gottlieb et al, 2000), backscattered electron intensities (Gu, 2003) or specular reflectance spectra (Pirard, 2004). The resulting mineral mappings typically serve as an input to the first principle of stereology to straightforwardly derive the volumetric ratios of minerals from planar ratios.…”
Section: Image Analysis Of Particulate Ore Materialsmentioning
confidence: 99%
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“…This still faces major limitations but can be addressed using, or combining, energy dispersive X-ray spectra (Gottlieb et al, 2000), backscattered electron intensities (Gu, 2003) or specular reflectance spectra (Pirard, 2004). The resulting mineral mappings typically serve as an input to the first principle of stereology to straightforwardly derive the volumetric ratios of minerals from planar ratios.…”
Section: Image Analysis Of Particulate Ore Materialsmentioning
confidence: 99%
“…This would require a system able to locate any pixel on a high resolution 3D grid and give it both a chemical and a crystallographical attribute. Most research teams involved in modal analysis or liberation analysis of ores have adopted the Scanning Electron Microscope as their privileged imaging device (Gottlieb et al, 2000;Petruk, 1998). This allows for high resolution images to be collected either as single-valued back-scattered electron (BSE) images or as a multiple set of elementary mappings derived from the energy dispersive X-Ray spectrum of each pixel (EDX).…”
Section: Mineralogical Imagingmentioning
confidence: 99%
“…Baseada fundamentalmente em geometria e estatística, essa técnica utiliza amostragem aleatória e sistemática para fornecer dados sem viés (HENLEY, 1983b). Assim, a qualidade dos resultados obtidos é dependente dos procedimentos de amostragem e de preparação (GOTTLIEB et al, 2000).…”
Section: Análise De Imagens E Estereologiaunclassified
“…Quanto mais fina for a textura, no caso, granulometria fino e distribuída, menor será esse tipo de erro (GOTTLIEB et al, 2000;SPENCER;SUTHERLAND, 2000).…”
Section: Figura 8 -Erros Estereológicos Decorrente Da Natureza Das Paunclassified
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