Using magnetic resonance characteristics to model the structure of multilayer composite nanosystems

Vyzulin, S. A.; Syr’ev, N. E.

doi:10.3103/s1062873816060423

Search citation statements

Order By: Relevance

Paper Sections

Select...

Introduction1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2017

2021

Publication Types

Select...

Article2

Relationship

Self Cite1

Independent1

Authors

Journals

Cited by 2 publications

(2 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…2, the values of α i are approximately 8°, 172°, 188°, and 352°. A similar character of changes in ΔH(α) and J(α) is observed for bulk samples [5]. However, the dynamic range of changes in ΔH and J from α for thin Fe x Ni 100-x films is much greater (no less than an order of magnitude).…”

supporting

confidence: 69%

“…The sensitivity of FMR toward samples of film nanostructures ensures high accuracy in measuring their resonance parameters (i.e., the intensity of the resonance field and the width and intensity of absorption lines) [4]. It allows us to establish relationships between data obtained in examining the ferromagnetic resonance and microscopic material parameters of nanofilm systems [5] with no special preparation of samples.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation