25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) 2014
DOI: 10.1109/asmc.2014.6847007
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Using in-line film measurement as a proxy for device matching to speed up process change qualification

Abstract: We describe two cases where we were able to use in-line macro measurement data to pre-select processes and to do necessary adjustments to prospect matching devices for process qualification. This approach dramatically shortens the time for new process qualification. Keywords-, device matching, in-line measurements, screen oxide, process change qualificationI.

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