Abstract:Electrochemical Impedance Spectroscopy (EIS) and the Parallel Electrical Dielectric Response Analysis (PEDRA) application were used to describe the inner barrier oxide films on irradiated zirconium alloys. This is achieved with minimal surface preparation and without disturbing the outer porous oxide. These two distinguishable inner and outer oxide layers result from a growthfracture oxidation mechanism. Key to success of the EIS technique in describing the barrier oxide layer are: 1) the model and procedure u… Show more
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