2014
DOI: 10.1109/temc.2014.2313231
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Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-Shorted-Trace Coupling

Abstract: International audiencePredicting the immunity of electronic boards to radiated electromagnetic interference requires the computation of the coupling efficiency of an electromagnetic field to PCB traces. In the case of complex PCBs, full-wave electromagnetic solvers are convenient, yet at the expense of simulation time. Therefore, this paper introduces the extension of a modified Taylor-based analytical model to the case of traces terminated at one end by a non-characteristic impedance. This model makes it poss… Show more

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Cited by 8 publications
(8 citation statements)
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“…Finally, the case of a multi-segment microstrip trace will be considered. This development is a quick summary of the author's earlier work, a mathematical derivation can be found in [14] and an intuitive explanation in [15].…”
Section: Characteristic Loadsmentioning
confidence: 92%
See 1 more Smart Citation
“…Finally, the case of a multi-segment microstrip trace will be considered. This development is a quick summary of the author's earlier work, a mathematical derivation can be found in [14] and an intuitive explanation in [15].…”
Section: Characteristic Loadsmentioning
confidence: 92%
“…In order to understand real-life coupling problems, the limitations (elevation, polarization and termination) should be removed one by one, without losing transparency. The authors started to analyze the case of a one-sided arbitrary termination [15].…”
Section: Contributionmentioning
confidence: 99%
“…One end of the trace is terminated by the IC's impedance as measured in Section IV-B. The other end is terminated by the PCB transition to the SMA reference plane, modeled as a lossless 48.2 ps delay [14], followed by the supply bias tee. The reflection coefficient of the bias tee was measured with a matched load and the short standard, respectively, to model both configurations.…”
Section: Cascading Trace and Icmentioning
confidence: 99%
“…Intensive efforts have been made to find the dependencies of the field-to-line coupling, such as terminal impedance [1][2][3] and structure [3,4] of the line. Full-wave electromagnetic solvers are introduced to simulate the behavior of the field-to-line coupling, but this kind of models is complicated for EMC designers to use because of the cumbersome parameters of actual EMI incidence.…”
Section: Introductionmentioning
confidence: 99%
“…Full-wave electromagnetic solvers are introduced to simulate the behavior of the field-to-line coupling, but this kind of models is complicated for EMC designers to use because of the cumbersome parameters of actual EMI incidence. Recently, transverse electromagnetic (TEM) or gigahertz TEM (GTEM) cell measurements have been widely used for investigations on both line-to-field and field-to-line couplings [3,[5][6][7][8][9], which are specified by international standards [10,11] for radiated emission and immunity tests, as a low-cost alternative to the measurements over an open-area test site (OATS).…”
Section: Introductionmentioning
confidence: 99%