Use of waveguide light scattering for precision measurements of the statistical parameters of irregularities of integrated optical waveguide materials

Yegorov, Alexandre A.

doi:10.1117/1.1828469

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Cited by 7 publications

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“…We did not analyze the effect of waveguide light scattering due to irregularities, since this issue has already been addressed in detail. [4][5][6][7][8] In conclusion, we have characterized an integrated optical ammonia sensor. The device exhibits high metrological performance (sensitivity, accuracy, linearity, reproducibility of results, fast response, absence of hysteresis, and relatively high S/N).…”

Section: Spie Newsroommentioning

confidence: 99%