Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases

Zhdan, V. T.; Kozlovskiĭ, A. V.; Mozhaev, A. N.; Pilyugin, I. I.

doi:10.1134/s1061934810140145

J Anal Chem

2010

DOI: 10.1134/s1061934810140145

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Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases

V. T. Zhdan¹,

A. V. Kozlovskiĭ²,

A. N. Mozhaev³

et al.

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Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases

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References 3 publications

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