2009
DOI: 10.1016/j.eswa.2009.03.004
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Use of neural network to model X-ray photoelectron spectroscopy data for diagnosis of plasma etch equipment

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Cited by 5 publications
(3 citation statements)
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“…For fault diagnosis of the Tennessee-Eastman benchmark process, a hierarchical neural network based on fuzzy clustering method has been designed . Other nonlinear process monitoring methods related to principal curves and neural networks have also been developed recently. …”
Section: State-of-the-art Of Data-based Process Monitoringmentioning
confidence: 99%
“…For fault diagnosis of the Tennessee-Eastman benchmark process, a hierarchical neural network based on fuzzy clustering method has been designed . Other nonlinear process monitoring methods related to principal curves and neural networks have also been developed recently. …”
Section: State-of-the-art Of Data-based Process Monitoringmentioning
confidence: 99%
“…To achieve equilibrium between the tracking error and the chattering, an ASMC based on the bipolar sigmoid function is proposed, 26,27 which can be derived from equation (6).…”
Section: Asmc Based On Bipolar Sigmoid Functionmentioning
confidence: 99%
“…ð27Þ where u 1 is the control law (6), u 2 is the internal controller (26), and > 0 is a small constant, as illustrated in Figure 6.…”
Section: Asmc Based On Hyperbolic Tangent Functionmentioning
confidence: 99%