Use of intensity of the X-ray radiation disseminated by substance in practice of X-ray fluorescent analysis

Tsvetyanskii, A. L.; Eritenko, A. N.

doi:10.15826/analitika.2014.18.1.001

Cited by 2 publications

(2 citation statements)

References 17 publications

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“…The correctness of Equation ( 4) is supported by the small contribution of incoherent scattering to the total scattering intensity in the X-ray region of the spectrum, which confirms the effectiveness of using the polarization of primary radiation in solving practical problems. [1,2] A number of researchers [9][10][11][12] still mistakenly believe, that the Klein-Nishina-Tamm Equation [3,4] determines the intensity only incoherently scattered X-ray, although the resulting excessive contribution of this scattering is unacceptable when solving practical problems.…”

Section: Scattering On a Resting Electronmentioning

confidence: 99%

Ratio of incoherent and coherent scattering intensities of X‐ray and γ‐radiation

Pavlinsky

2021

X-Ray Spectrometry

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It is shown that the Klein–Nishina–Tamm equation determines the total intensity of coherent and incoherent X‐ray scattering. The change in the ratio of these components during the transition from scattering on a resting electron to scattering on the atomic electrons is estimated. Taking into account the innovations, the required ratio is calculated for the atom of three elements with a limited set of scattering angles. The basic expression for incoherent scattering in the Klein–Nishina–Tamm equation allows us to agree, in the first approximation, the calculated value of the total scattering intensity with the experimentally observed results. The current dependences for the intensity of coherent and incoherent x‐ray scattering on the massive multicomponent materials are presented.

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Section: Scattering On a Resting Electronmentioning

confidence: 99%

Ratio of incoherent and coherent scattering intensities of X‐ray and γ‐radiation

Pavlinsky

2021

X-Ray Spectrometry

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“…The intensity ratio of these peaks is used in the practice of XRF analysis to take into account the matrix effects and determination of the content of light impurities …”

Section: Introductionmentioning

confidence: 99%

Light element depth distribution by the intensity ratio of incoherent and coherent scattering

et al. 2019

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A method is proposed for analyzing the distribution of elements with a small atomic number Z < 9 over the depth of the substrate. The method is based on measuring the ratio of incoherent and coherent scattering peaks intensities at different exit angles of X‐rays from the sample surface. Varying the beam exit angle at a constant scattering angle makes it possible to vary the depth of radiation penetration into the sample by almost two orders of magnitude and, correspondingly, to vary the information averaging zone. Mathematically, the method reduces to the numerical solution of integral equations of the first kind, in which the impurity distribution profile is given by the model function. Experimental measurements were performed on model samples of beryllium (Z = 4) and aluminum (Z = 13) foils and real coatings of boron (Z = 5) and titanium nitride. The adequacy of the received solutions to the certified characteristics is shown.

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Use of intensity of the X-ray radiation disseminated by substance in practice of X-ray fluorescent analysis

Cited by 2 publications

References 17 publications

Ratio of incoherent and coherent scattering intensities of X‐ray and γ‐radiation

Ratio of incoherent and coherent scattering intensities of X‐ray and γ‐radiation

Light element depth distribution by the intensity ratio of incoherent and coherent scattering

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