Use of in-situ spectroscopic ellipsometry to study aluminium/oxide surface modifications in chloride and sulfuric solutions

In Situ Study of the Deposition of (Ultra)thin Organic Phosphonic Acid Layers on the Oxide of Aluminum

“…The optical constants for the blank substrate are in good agreement for the ones mentioned in literature for an electropolished and barrier anodized sample in diammoniumtartrate: A = 1.65 and B = 0.007. 32 Also the percent of aluminum oxide does agree with the literature value of 34%.…”

“…In between both layers, it was shown that there is an intermix layer. 32 This intermix consists of an effective medium approximation layer (EMA) of aluminum oxide and aluminum (see also the Supporting Information). As most of the literature values for the optical constants of aluminum oxide are measured for the ideal crystalline sapphire form of the oxide, the optical constants of the samples used need to be fitted.…”

Electrochemical passive properties of AlxCoCrFeNi (x = 0, 0.25, 0.50, 1.00) high-entropy alloys in sulfuric acids

“…The inability of the anions to form oxide implies the continuous formation of metastable ion complexes and dissolution of ions. Since Al easily forms [Al(SO 4 )] + with (SO 4 ) 2-, and Al(OH)SO 4 with (SO 4 ) 2-and (OH) − , respectively [36], these metastable ion complexes combine with Cl − and dissolve afterwards. Therefore, pitting easily occurs on the surface of aluminum alloys.…”

Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE‐AES

“…The thickness of the oxide layers is typically characterised using visual ellipsometry. [2] XPS has been widely used to analyse the chemistry of the formed oxide layers. [3 -6] Several authors have studied the O KL 2,3 L 2,3 and/or Al KL 2,3 L 2,3 Auger electron lines using X-ray-induced Auger electron spectroscopy (XAES) in pure aluminium and Al 2 O 3 .…”