1961
DOI: 10.1149/1.2428089
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Use of Hall Measurements in Evaluating Polycrystalline Silicon

Abstract: Hall measurements at room temperature have been used to determine the average net carrier density in polycrystalline silicon. The method does not require cutting of samples and destruction of the rods. Current contacts are made to the ends of a rod with strips of metal foil; Hall contacts are made with two titanium blades which close on the rod. Hall measurements made this way on single-crystal zone-refined rods agree with measurements on samples cut from the rods in the conventional manner. The average carrie… Show more

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