2018
DOI: 10.1007/s11249-018-1114-y
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Use of FIB to Study ZDDP Tribofilms

Abstract: Focussed ion beam milling (FIB) followed by TEM has been used to study ZDDP tribofilms on rubbed steel surfaces. It has been found that the impact of high energy platinum and gallium ions during FIB causes significant morphological and structural changes to the uppermost 30-50 nm of a ZDDP tribofilm. This can be prevented by the low energy deposition of a quite thick gold layer prior to installation of the sample in the FIB facility. This problem, and its solution, have been quite widely reported in the non-tr… Show more

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Cited by 19 publications
(20 citation statements)
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“…To investigate tribofilm crystallinity using transmission electron microscopy (TEM), lamellae of ZDDP tribofilm cross sections were extracted using a Helios 600 NanoLab Focused Ion Beam (FIB) instrument. Before this, the ZDDP tribofilms were coated with a 50-70-nm gold layer to protect them from damage during gallium ion milling [14]. Table 3 shows the conditions used in the FIB process.…”
Section: Tribofilm Crystallinitymentioning
confidence: 99%
See 1 more Smart Citation
“…To investigate tribofilm crystallinity using transmission electron microscopy (TEM), lamellae of ZDDP tribofilm cross sections were extracted using a Helios 600 NanoLab Focused Ion Beam (FIB) instrument. Before this, the ZDDP tribofilms were coated with a 50-70-nm gold layer to protect them from damage during gallium ion milling [14]. Table 3 shows the conditions used in the FIB process.…”
Section: Tribofilm Crystallinitymentioning
confidence: 99%
“…Most previous research has found or assumed that ZDDP tribofilms consist primarily of amorphous and glassy zinc phosphates. However, using high-resolution FIB-TEM it has recently been shown that ZDDP tribofilms may have both nanocrystalline and amorphous structures [14].…”
Section: Introductionmentioning
confidence: 99%
“…Tribofilm analysis is typically performed ex situ and ex post. For insight at the atomic and molecular level, X-ray photoelectron spectroscopy, X-ray absorption near-edge structure spectroscopy, time-of-flight secondary ion mass spectroscopy, and transmission electron microscopy, among others, are common practice (see, for example, [27][28][29][30]). Such ex situ studies have recently been complemented by in situ observations of tribofilm growth at the macroscale by integrating a tribometer in a synchrotron X-ray absorption spectrometer [31,32] and at the nanoscale through use of an atomic force microscope to both mechanically drive film growth and image that growth [33].…”
Section: Introductionmentioning
confidence: 99%
“…18 shows a magnified image of part of the film. These indicate that all of the film has a nanocrystalline structure, as also seen with the ZDDP film prior to rubbing in OFM solution [34]. EDX analysis of the FIB wafer shows that the film is comprised predominantly of O, P and Zn with some sulphur in the 30-nm closest to the steel substrate but none further away from the steel surface [37].…”
Section: Film Compositionmentioning
confidence: 94%
“…TEM was employed to investigate the structure of the ZDDP film and EDX to map the elemental composition of the lamellae. The process of TEM specimen preparation is fully described in [34].…”
Section: Focused Ion Beam (Fib)-transmission Electron Microscopy (Tem)mentioning
confidence: 99%