2005
DOI: 10.1007/s10967-005-0644-6
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Use of combined NAA and SIMS analyses for impurity level isotope detection

Abstract: Neutron activation analysis (NAA) offers advantages for detecting impurity levels of select isotopes that have suitable neutron cross sections. Secondary ion mass spectrometry (SIMS) on the other hand detects most isotopes, but suffers various molecular interferences and covers only a small beam size volume per run. These two methods are combined here to study a large number of isotopes in titanium thin films in an electrolytic cell experiment. Nine isotopes are covered by NAA and over 50 with SIMS. An overlap… Show more

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Cited by 9 publications
(1 citation statement)
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“…This technique shows high sensitivity toward some specific elements, even superior to other detection methods within a range of 0.1-100 ppb [53]. Gold and aluminum concentrations were observed up to 1.88 and 40.66 ppm using the NAA technique, respectively, whereas the detection limits of the NAA instrument for gold and aluminum were 0.02 and 1.6 ppm, respectively [54].…”
Section: Naamentioning
confidence: 99%
“…This technique shows high sensitivity toward some specific elements, even superior to other detection methods within a range of 0.1-100 ppb [53]. Gold and aluminum concentrations were observed up to 1.88 and 40.66 ppm using the NAA technique, respectively, whereas the detection limits of the NAA instrument for gold and aluminum were 0.02 and 1.6 ppm, respectively [54].…”
Section: Naamentioning
confidence: 99%