Superconducting ultrathin films grown epitaxially onto
crystalline substrates exhibit strained epitaxial growth due to lattice
mismatch, which can have a significant effect on their superconducting
properties. We present a complete correlation of the surface morphology,
crystal growth, strain, microstructure, and superconducting properties
in single-crystal Nb(110) thin films sputter deposited on a-plane sapphire substrates. Notably, we observe that the
lattice mismatch between Nb and sapphire induces the formation of
a hexagonal surface structure during the first three atomic layers.
This is followed by a strained bcc Nb(110) phase
whose in-plane lattice parameter progressively relaxes to bulk value.
Similar lattice relaxation was also observed in the direction perpendicular
to the interface using X-ray diffraction (XRD) and transmission electron
microscopy (TEM). Significant perpendicular strain in films up to
30 nm thick was found to ultimately affect the superconducting properties
of the Nb thin films as demonstrated with AC susceptibility measurements,
where dissipative effects in the lattice associated with the presence
of strain and associated defects were identified.