“…= 1.022, max. = 1.049; 2Oma x = 60 ° (0 _< h _< 15, 0 ___ k_ 16, -12 _< l___ 12); three standard reflections were recorded every 27 reflections (_+ 1.5%), 3204 reflections measured in 8-20 scan mode, 3065 unique, 335 rejected by profile scan (Gliek, 1975), 538 unobserved with I < 3a, 2048 with I _> 3a(/); structure solved with MULTAN80 (Main, Fiske, Hull, Lessinger, Germain, Declereq & Woolfson, 1980), all non-H atoms found from best E map (CFOM = 3.00); H positions found in difference Fourier maps; H-atom positional parameters refined, B's constant at B n + 1, where n is the atom to which the H is bound; all non-H atoms refined with anisotropic thermal parameters; (Main et al, 1980); refinement and Fourier analysis -LINUS (Andrews, 1974, from ORFLS, Busing, Martin & Levy, 1962); Fourier analysis and difference maps -FORDAP (Zalkin, 1962); analysis of variance -NANOVA (Lalancette, Cefola, Hamilton & La Placa, 1967); bond-distance and bond-angle error analysis -ORFFE (Busing, Martin & Levy, 1964); graphics -OR TEPII (Johnson, 1970).…”