2014
DOI: 10.1103/physrevb.90.214515
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Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition

Abstract: Thin superconducting films form a unique platform for geometrically confined, strongly interacting electrons. They allow an inherent competition between disorder and superconductivity, which in turn enables the intriguing superconducting-to-insulating transition and is believed to facilitate the comprehension of high-T c superconductivity. Furthermore, understanding thin film superconductivity is technologically essential, e.g., for photodetectors and quantum computers. Consequently, the absence of established… Show more

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Cited by 82 publications
(109 citation statements)
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“…derived the dependence of kinetic inductance on material conductivity and energy gap, or equivalently, on the normal resistance and critical temperature: Lnormalk=πnormalΔσnormaln·lw·d=Rnormaln1.76πknormalBTnormalcwhere d is the wire thickness. Moreover, the relationship between the critical temperature, and the film thickness and sheet resistance has also been formulated empirically for a broad range of superconductors near the SIT limit: Tnormalc=A·RB, where A and B are material‐dependent constants that help classify the homogeneity of the superconductor (typically, B1 is the limit above which the materials are not crystalline, but amorphous) . This division is in agreement with accumulated data that suggest that the properties of amorphous and crystalline SNSPDs are different (with an emphasize on crystalline NbN and amorphous tungsten silicide, which are shown in Figure ).…”
Section: Introduction: Quantum Materials For Quantum Sensingsupporting
confidence: 71%
See 1 more Smart Citation
“…derived the dependence of kinetic inductance on material conductivity and energy gap, or equivalently, on the normal resistance and critical temperature: Lnormalk=πnormalΔσnormaln·lw·d=Rnormaln1.76πknormalBTnormalcwhere d is the wire thickness. Moreover, the relationship between the critical temperature, and the film thickness and sheet resistance has also been formulated empirically for a broad range of superconductors near the SIT limit: Tnormalc=A·RB, where A and B are material‐dependent constants that help classify the homogeneity of the superconductor (typically, B1 is the limit above which the materials are not crystalline, but amorphous) . This division is in agreement with accumulated data that suggest that the properties of amorphous and crystalline SNSPDs are different (with an emphasize on crystalline NbN and amorphous tungsten silicide, which are shown in Figure ).…”
Section: Introduction: Quantum Materials For Quantum Sensingsupporting
confidence: 71%
“…The above distinction between amorphous and crystalline SNSPDs raises a motivation to optimize the amorphousness of a superconductor. Following a recent analysis of the effects of amorphousness on superconducting thin films, such optimization may open a new path for SNSPDs that benefit from the competitive detection properties of amorphous materials as well as from the superior timing performance of crystalline superconductors. It has been suggested recently that using bilayers of amorphous and crystalline materials gives rise to hybridization of the superconducting properties via the proximity effect ( Figure ).…”
Section: Intrinsic Properties and Functionalitymentioning
confidence: 99%
“…We then record the critical temperature (T c ) and sheet inductance (L ) for a range of different film thicknesses ( Fig. 1a and Table I that links thickness, T c , and sheet resistance, which has been observed for other thin superconducting films [23]. Moreover, the exponent B = 0.67 ± 0.02 we measure is similar to TiN from other work [24].…”
supporting
confidence: 71%
“…The behaviour can be partially modelled using proximity effect and quantum size effect theories 34,35 which argue that the transition temperature varies with thickness directly, however an alternative analysis shows that there is a correlation between transition temperature and resistivity 36 which has some theoretical explanation. 37 Resistivity is shown as a function of film thickness in figure 4.…”
Section: -mentioning
confidence: 99%