Unified System Level Fault Modeling and Fault Propagation

Abstract

Fault modeling is an important step towards both understanding and validating the implemented system. The focus of the paper is to present a unified system fault modelling framework, including input related faults model based on system theory. The complex embedded system (CES) is modelled using sequence of communicating FSM (SCFSM) and the system faults are represented by two components of system fault vector -system behaviour fault vector and system communication fault vector. These two system fault vector components are related and are components of the "change parameter vector Θ", a general system level fault model based on Dynamic system theory. Input related faults are defined and their contribution is discussed. Faults propagation in mixed hardware software communication architecture is discussed, with the help of protocol example. General TermsFault modeling and propagation, Embedded Systems development.

An Adaptive Design Methodology for Reduction of Product Development Risk

“…The integration testing of MDS can be viewed as identification of faulty communication channel [30,43] or faulty machine [30,44] problem. It is shown that mathematical functions and logical expressions can be used as, partial specifications and test data can be automatically generated [41].For the integration testing the idea of faulty communication channel is very logical, as the objective of integration testing is to uncover errors in the interaction between the components and their environment.…”

“…The DOP model specifies necessary information for development and also test generation. To efficiently test any system, it is important to know the possible failures, causes and the way they propagate [30]. The first step is the identification and classification of design faults that occur during the early developmental stages.…”

“…The first step is the identification and classification of design faults that occur during the early developmental stages. For physical systems the input values are required to be limited to certain bounds in their range of values: called input bound limits [30]. Based on DOP model, platform independent test suites can be generated.…”