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2024
DOI: 10.1037/prj0000596
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Unidimensional versus multidimensional: A bifactor factor structure of the Self-Stigma Scale–Short (SSS-S) among U.S. adults with psychiatric disabilities.

Deyu Pan,
Zachary A. Babb,
Wilson J. Brown
et al.

Abstract: Objective: This study aimed to examine the psychometric properties of the English version of the Self-Stigma Scale-Short (SSS-S), a nine-item self-report self-stigma measurement, among U.S. adults with psychiatric disabilities. Method: We obtained reliability and validity evidence from a sample of 275 adults with psychiatric disabilities. Results: Exploratory factor analysis (EFA; n = 139) yielded a two-factor solution that accounts for 64.97% of the variance. Confirmatory factor analysis (CFA; n = 136) was co… Show more

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