2009
DOI: 10.1016/j.microrel.2009.06.037
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Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation

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Cited by 3 publications
(4 citation statements)
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“…This is certainly due to the test set-up configuration leading to an increase of the electrode resistance. The effect of the mechanical stress on the saturation current is directly linked to the strong dependency of the electron mobility to the mechanical stress as it has been already investigated in [2,3,4].…”
Section: Static Operating Configurations Simulation Resultsmentioning
confidence: 99%
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“…This is certainly due to the test set-up configuration leading to an increase of the electrode resistance. The effect of the mechanical stress on the saturation current is directly linked to the strong dependency of the electron mobility to the mechanical stress as it has been already investigated in [2,3,4].…”
Section: Static Operating Configurations Simulation Resultsmentioning
confidence: 99%
“…VJn =qR net +q- (3) at -op -VJp =qR net + q - (4) at The continuity equations for the electron and hole respectively are:…”
Section: Anmentioning
confidence: 99%
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“…Potentially, Buck-Boost DC-DC transformerless converters can face short-circuit failure modes under certain conditions. Sources [21][22][23][24][25][26] offer significant information in this direction as follows: IGBT structural behavior under short-circuit [21]; breakdown and thermal runaway mechanisms leading to destructive failure [22]; damages from electrostatic discharge [23]; IGBTs' mechanical stress under short-circuit conditions [24]; turn-off failure mechanism [25]; robustness of IGBT modules during turn-off commutation.…”
Section: Introductionmentioning
confidence: 99%