2013
DOI: 10.1088/1757-899x/45/1/012013
|View full text |Cite
|
Sign up to set email alerts
|

Understanding the thermal annealing process on metallic thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

1
14
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 20 publications
(15 citation statements)
references
References 7 publications
1
14
0
Order By: Relevance
“…Sputtering is a physical vapor deposition method that may achieve quite a uniform coating over quite large areas by controlling the surface roughness and grain sizes [25]. The increased temperature of the surface during the process causes an oxygen migration towards the Mo coating that, together with the vacuum conditions, may affect the presence of the multiphase structure of the films.…”
Section: Molybdenum Coatingsmentioning
confidence: 99%
“…Sputtering is a physical vapor deposition method that may achieve quite a uniform coating over quite large areas by controlling the surface roughness and grain sizes [25]. The increased temperature of the surface during the process causes an oxygen migration towards the Mo coating that, together with the vacuum conditions, may affect the presence of the multiphase structure of the films.…”
Section: Molybdenum Coatingsmentioning
confidence: 99%
“…Annealing process is seen to decrease the sheet resistivity of undoped SnO 2 thin film slightly. This is because annealing process is ascribed to decrease intrinsic stress, improve on lattice mismatch and create longer mean paths for free electrons hence increasing their mobility thereby improving on the electrical conductivity of the thin films [28,35]. When the thin films were passivated, there was a slight increase in resistivity for the passivated samples which is attributed to increase in the formation of nanocrystalline grains [33] or effects arising from annealing the thin film in an oxygen deficient atmosphere [7].…”
Section: Optical Characterizationmentioning
confidence: 99%
“…Figure 8 shows the effect of annealing and passivation on F: SnO 2 thin films prepared at 16.41 at% F which had a low resistivity of 0.00075 Ωcm. Annealing effects led to further decrease in resistivity of F: SnO 2 thin films which is attributed to increase in crystallinity, hence mobility of free charge carriers [35,36]. Passivation had an opposite effect which is attributed to increase in the formation of nanocrystalline grains [33] or effects arising from annealing the thin film in an oxygen deficient atmosphere [7].…”
Section: Optical Characterizationmentioning
confidence: 99%
See 2 more Smart Citations