2021
DOI: 10.1109/jphotov.2021.3062969
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Understanding the Origin of Recombination Losses After Co-Plating of Bifacial Solar Cells: In-Depth Microstructure Study

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(7 citation statements)
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“…This can cause significant parasitic absorption in the cells. Furthermore, as mentioned above, the activation step before plating etches (consumes) some of the Si, but the etch rate of p‐doped Si is much lower than n‐doped Si 24 . Therefore, there is room to decrease the thickness of the front poly‐Si.…”
Section: Resultsmentioning
confidence: 99%
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“…This can cause significant parasitic absorption in the cells. Furthermore, as mentioned above, the activation step before plating etches (consumes) some of the Si, but the etch rate of p‐doped Si is much lower than n‐doped Si 24 . Therefore, there is room to decrease the thickness of the front poly‐Si.…”
Section: Resultsmentioning
confidence: 99%
“…It is noted that the polysilicon thickness listed here is estimated from the etch rate of poly‐Si, measured on test wafers (by cross‐section SEM images) after etching in TMAH for varying times. Loss in poly‐Si thickness due to laser ablation 10 and due to plating activation 24 was not measured. Compared with the inkjet‐patterned cells, the cells with the laser oxidation route show >1% absolute higher FF, even though a lower thermal budget (same as previous batches of cells) was used.…”
Section: Resultsmentioning
confidence: 99%
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