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2020
DOI: 10.1039/d0nr06459a
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Understanding metal organic chemical vapour deposition of monolayer WS2: the enhancing role of Au substrate for simple organosulfur precursors

Abstract: We find that the use of Au substrate allows fast, self-limited WS2 mono-layer growth using a simple sequential exposure pattern of low cost, low toxicity precursors, namely tungsten hexacarbonyl and...

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Cited by 13 publications
(11 citation statements)
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“…The typical diffraction peaks appearing at 14.3° and 28.9° for WS 2 /CNTsHMS are assigned to (002) and (004) planes of WS 2 . [40,41] Furthermore, the other peaks are corresponding to 2H-WS 2 (JCPDS Card No. 08-0237), which confirms the successful reaction of tungstate ions and H 2 S to form WS 2 during the synthesis process.…”
Section: Resultsmentioning
confidence: 99%
“…The typical diffraction peaks appearing at 14.3° and 28.9° for WS 2 /CNTsHMS are assigned to (002) and (004) planes of WS 2 . [40,41] Furthermore, the other peaks are corresponding to 2H-WS 2 (JCPDS Card No. 08-0237), which confirms the successful reaction of tungstate ions and H 2 S to form WS 2 during the synthesis process.…”
Section: Resultsmentioning
confidence: 99%
“…Further investigating the chemical nature of the C incorporation, we do not find evidence for the formation of possible C−Mo bondings, which would be apparent in the C 1s region at lower binding energies of around 282.8 eV. 42 Therefore, within the detection limit of our XPS study, we postulate that the C incorporation in our films is mainly composed of a graphitic C(sp 2 ) layer codeposited with MoS 2 rather than substitutional doping of C into the MoS 2 sheet, 39 Mo 2 C carbide formation, 28,42 or CH groups at chalcogen sites previously reported in synthetic TMDs. 41 This agrees with the theoretical prediction that substitution of S with C atoms at the MoS 2 edge is thermodynamically unfavorable 20 and is further supported by the experimental observation that carbide conversion of MoS 2 does not occur below 800 °C.…”
Section: Resultsmentioning
confidence: 60%
“…22,32,37 Therefore, DES is unequivocally identified as the source of C incorporation, which is consistent with previous reports of TMD growth processes using organic chalcogen precursors. 28,32,36 To further explore the role of DES as a source of C incorporation, single-source DES exposure of the SiO 2 surface was studied as a function of growth temperature. As evident from Figure 4a, there is a rising intensity of the D and G bands with increasing temperature.…”
Section: Resultsmentioning
confidence: 99%
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“…Figure a,b shows the high-resolution XPS spectra of the Co 2p, Fe 2p, Mo 3d, Ni 2p, and W 4f and W 5p peak regions with the fitted peak components for different transition-metal spectra of transition-metal sulfide and selenide samples, respectively. It can be clearly seen that all the observed peaks correspond to the transition-metal chalcogen bond and satellite features (Co 2p 1/2 peaks at 793.7 and 797.3 eV, Co 2p 3/2 peaks at 778.8 and 781.6 eV, and Fe 2p 1/2 and Fe 2p 3/2 peaks at 725.0 and 712.0 eV, respectively; Mo 3d 3/2 peaks at 232.6 and 235.8 eV and Mo 3d 5/2 peak at 229.4 eV; Ni 2p 1/2 and Ni 2p 3/2 peaks at 872.9 and 855.2 eV, respectively; and W 4f 5/2 , W 4f 7/2 , and W 5p 3/2 peaks at 33.7, 31.5, and 37.5 eV, respectively). In addition, it can be seen that peaks of S 2p 1/2 , S 2p 3/2 , Se 3d 3/2 , and Se 3d 5/2 with binding energies at 163.0, 161.8, 55.7, and 54.9 eV, respectively, are assigned to the transition-metal chalcogen bond (Figures S4 and S5). These XPS results confirm that different types of TMCs were successfully formed by the electrochemical deposition method.…”
Section: Resultsmentioning
confidence: 97%