Understanding Grader Reliability through the Lens of Cognitive Modeling

Hicks, Nathan M.; Douglas, Kerrie A.; Diefes‐Dux, Heidi A.

doi:10.18260/1-2--33477

2019 ASEE Annual Conference &Amp; Exposition Proceedings

DOI: 10.18260/1-2--33477

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Understanding Grader Reliability through the Lens of Cognitive Modeling

Nathan M. Hicks

Kerrie A. Douglas

Heidi A. Diefes‐Dux

Abstract: School of Engineering Education. Her research is focused on improving methods of assessment in large learning environments to foster high-quality learning opportunities. Additionally, she studies techniques to validate findings from machine-generated educational data.

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Understanding Grader Reliability through the Lens of Cognitive Modeling

Abstract: School of Engineering Education. Her research is focused on improving methods of assessment in large learning environments to foster high-quality learning opportunities. Additionally, she studies techniques to validate findings from machine-generated educational data.

Cited by 0 publications

References 17 publications

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