2010
DOI: 10.1063/1.3520139
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Understanding efficiency droop effect in InGaN/GaN multiple-quantum-well blue light-emitting diodes with different degree of carrier localization

Abstract: Two light-emitting diode samples are grown with InGaN and GaN underlying layers beneath the multiple quantum wells (MQWs), respectively. By measuring the carrier lifetime as a function of photon energy, it is found that the MQW with InGaN underlying layer has a higher degree of carrier localization. Comparison between the external quantum efficiency and injection current of these two samples reveals that efficiency droop at small injection current is attributed to the delocalization of carriers, while further … Show more

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Cited by 107 publications
(72 citation statements)
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“…It is difficult to quantify the increase in radiative lifetimes produced by the built-in electric fields because, as will be discussed in detail later, it is impossible to assign a single time constant to the radiative recombination process. Nevertheless, at low temperatures, energy dependent radiative decay times for InGaN/GaN QWs are quoted [15][16][17][18] to be $10 s of nanoseconds compared with exciton decay times in GaAs/AlGaAs QWs $100 s of picoseconds. 19 It is widely accepted 18,[20][21][22][23][24] that the carrier localisation can, to a large extent, overcome non-radiative recombination associated with defects.…”
Section: à2mentioning
confidence: 99%
“…It is difficult to quantify the increase in radiative lifetimes produced by the built-in electric fields because, as will be discussed in detail later, it is impossible to assign a single time constant to the radiative recombination process. Nevertheless, at low temperatures, energy dependent radiative decay times for InGaN/GaN QWs are quoted [15][16][17][18] to be $10 s of nanoseconds compared with exciton decay times in GaAs/AlGaAs QWs $100 s of picoseconds. 19 It is widely accepted 18,[20][21][22][23][24] that the carrier localisation can, to a large extent, overcome non-radiative recombination associated with defects.…”
Section: à2mentioning
confidence: 99%
“…However, the gradual decrease in internal quantum efficiency (IQE) with increasing input current, called efficiency droop, is a major obstacle in the widespread adoption of LEDs for general illumination. Many physical mechanisms including Auger recombination, 1,2 delocalization of carriers from In-rich low-defectdensity regions, 3,4 and electron leakage 5,6 have been proposed as the possible reasons for efficiency droop. Recently, Meyaard et al reported that the asymmetry in carrier transport, caused by much lower concentration and mobility of holes, compared with electrons, is the dominant mechanism causing for efficiency droop.…”
mentioning
confidence: 99%
“…An understanding of the physical origin of the efficiency droop is critical for future progress in LEDs, particularly when operated at high current densities. Various mechanisms to explain the efficiency droop have been proposed, including delocalization of carriers [1,2], Auger recombination [3,4], and electron leakage [5,6]. Auger recombination (i.e., an electron drops non-radiatively from the conduction band to the valence band while transferring its energy to another electron or hole) has been regarded as a major cause of efficiency droop.…”
Section: Introductionmentioning
confidence: 99%