Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries

Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Reorda, M. Sonza

doi:10.1109/dft59622.2023.10313530

2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023

DOI: 10.1109/dft59622.2023.10313530

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Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries

V. Turco,

A. Ruospo,

G. Gavarini

et al.

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Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries

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References 14 publications

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