Uncertainty of measurement error in intelligent electronic devices

Abstract

This paper focuses on methodology to quantify uncertainty in measurements obtained from Intelligent Electronic Devices (IED). IEDs have emerged in distribution systems as a prevalent source of measurements in monitoring and protection, as well as for different kinds of applications beyond IED's primary purposes. These measurement devices are installed across a system, from substations down to the customer locations, and provide measurements of a wide array of quantities. We report how IED measurements respond to external disturbances, which may lead to possible accuracy impacts in various applications. The example used to illustrate the approach is highly accurate fault location in distribution systems based on voltage sag measurements.

Sensitivity of voltage sag based fault location in distribution network to sub-cycle faults

“…It appears, however, that these methods have not been used to improve voltage sag based fault location to cope with sub-cycle faults in distribution networks. In [32], authors show that the sub-cycle faults (greater than 0.5 cycle) can be located accurately with the proposed method when no measurement imperfections [33] (e.g. magnitude and phase errors) are present.…”

Advances on Uncertainty Quantification Techniques for Dynamical Systems: Theory and Modelling

“…The errors in the measures taken by electronic devices are typically modelled using Gaussian Random Variables N (µ, σ) where µ is the mean and σ the standard deviation [104]. In our case, assuming a measurement error of 5%, for each time instant t we take g t , the glucose level at time t, as the mean.…”