Abstract:A design methodology based on numerical modelling, Integrated with optimisation techniques and statistical methods, to aid the process control of micro and nanoelectronics based manufacturing processes is presented in this paper. The design methodology is demonstrated for a micro-machining process called Focused Ion Beam (FIB). This process has been modelled to help understand how a pre-defined geometry of micro-and nano-structures can be achieved using this technology. The process performance is characterised… Show more
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