Uncertainty Analysis in the Measurement of Switching Losses in GaN FETs Power Converters

Azpúrua, Marco A.; Pous, Marc; Silva, Ferran

doi:10.1109/i2mtc43012.2020.9129552

Cited by 2 publications

(2 citation statements)

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“…In addition to the previous considerations, a set of best practices must be followed to ensure accurate switching loss measurements. The most important ones are correcting offset errors, employing de-skew procedures, enhancing the dynamic range and reducing the waveform noise by adequately configuring the oscilloscope acquisition mode and using the appropriate probe tip and grounding to minimize the ground loop inductance [8], [12], [19] The above-mentioned recommendations are necessary, but not sufficient, to ensure an accurate measurement of the switching losses. This is because the probe-oscilloscope system produces distortion in the waveform, particularly when the probe's input capacitance is of the same order of magnitude as the capacitance of the device under test [20].…”

Section: A General Considerationsmentioning

confidence: 99%

“…In a preceding conference paper from the authors, the analysis of the switching loss measurement method was presented and, from there, bandwidth, timing, and distortion correction considerations were defined for the probeoscilloscope system. Subsequently, a top-down analysis was carried out for modeling and propagating the contributions to the switching losses' measurement uncertainty [12].…”

Section: Introductionmentioning

confidence: 99%

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Time- and Frequency-Domain Characterization of Switching Losses in GaN FETs Power Converters

Azpúrua

Pous

Silva

2022

IEEE Trans. Power Electron.

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This paper presents a methodology for the timefrequency characterization of switching losses in Gallium Nitride Field Effect Transistors used in power electronics applications, particularly in DC-DC converters. Typically, switching losses are measured in the time-domain through the integration of the instantaneous power, that is, the product of the voltage multiplied by the current, during the turn-on and turn-off transients. Nonetheless, as novel power transistors allow for switching times in the nanosecond range, the accuracy of such measurements is compromised by the limitations of the probe-oscilloscope systems in terms of bandwidth and dynamic range. Here, we analyze the time-domain switching loss measurement method, and then, through a complementary setup we demonstrate how to validate the results in the frequency domain. A DC-DC half-bridge buck converter circuit based on the EPC2001C was used as a representative test sample. Less than 1% of difference in critical parameters such as rise-time, pulse width, state-levels and, switching frequency, is encountered between the time and frequency domain approaches. Moreover, the measurement uncertainty was analyzed and estimated to be between ±1% and ±8%. This work allows for highly confident switching loss measurements, a better understanding of the switching phenomena and of the measurement system performance.

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Section: A General Considerationsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%