2001
DOI: 10.1103/physrevlett.86.2373
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Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator

Abstract: The (111) surface of CaF 2 was imaged with dynamic mode scanning force microscopy and modeled using atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern is due to the interaction of a positive electrostatic potential tip with fluorine ions in the two topmost surface layers. We find a good agreement of position and relative height of scan line features between theory and experiment and thus establish for the firs… Show more

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Cited by 155 publications
(121 citation statements)
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References 12 publications
(18 reference statements)
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“…This finding agrees well with experimental atomic force microscopy (AFM) studies in ultra high vacuum conditions of vacuum-cleaved slabs [70]. Furthermore, the (111) CaF 2 termination has been used as a model system to investigate the imaging mechanism of AFM measurements by comparing theory and experiment [71,72]. AFM images reveal a hexagonal arrangement of the topmost F anions with a regular spacing between them.…”
Section: Surface Reconstructions a (100) Caf 2 Reconstructionssupporting
confidence: 76%
“…This finding agrees well with experimental atomic force microscopy (AFM) studies in ultra high vacuum conditions of vacuum-cleaved slabs [70]. Furthermore, the (111) CaF 2 termination has been used as a model system to investigate the imaging mechanism of AFM measurements by comparing theory and experiment [71,72]. AFM images reveal a hexagonal arrangement of the topmost F anions with a regular spacing between them.…”
Section: Surface Reconstructions a (100) Caf 2 Reconstructionssupporting
confidence: 76%
“…A large number of high-quality atomically resolved experimental images have been produced with a blunt tip, and some of them are reported by and Foster, Barth, et al (2001). Therefore theoretical images, as well, have been calculated using a macroscopic tip of radius 675 nm and an applied bias of 0.03 V. Real tips were unsputtered, covered by oxide, and likely to be contaminated by surface material.…”
Section: B Simulating Scanningmentioning
confidence: 99%
“…Extensive SPM modeling suggests that only the shortrange chemical forces are responsible for atomic resolution (Livshits and Shluger, 1997b;Foster, Barth, et al, 2001;Hofer, Fisher, Wolkow, and Grü tter, 2001), whereas the macroscopic forces can be treated as a background attractive force. This background force is important in reproducing experimentally observed frequency changes in an SFM, but is independent of the identity of the atom under the tip and does not play a role in atomic displacements.…”
Section: Tip-surface Interactionmentioning
confidence: 99%
“…The method should prove valuable in determining the chemical forces in atomic force microscopy (AFM). Thus far, a perturbation method to treat these forces, which are at the bottom of atomic resolution [24,25], has proved elusive. As shown here, these forces can be calculated from the overlap of the wave functions of the decoupled systems and a single point of the energy curve of the coupled system.…”
mentioning
confidence: 99%