2013
DOI: 10.1063/1.4816624
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Ultraviolet vacuum ultraviolet optical functions for SrTiO3 and NdGaO3 crystals determined by spectroscopic ellipsometry

Abstract: Complex dielectric functions ε(E) = ε1(E) + ε2(E) were experimentally evaluated within the spectral range E = 2–25 eV and E = 2–20 eV for SrTiO3 and NdGaO3 single crystals, respectively, using synchrotron-based spectroscopic ellipsometry measurements. The ellipsometric spectra were evaluated within a framework of optical layer model taking into account sample surface roughness and anisotropy of NdGaO3. The parameters of Herzinger-Johs oscillator model were fitted to reproduce sufficiently all features of the o… Show more

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Cited by 6 publications
(6 citation statements)
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“…Note that measurements outside the cryostat in ambient conditions result in a thickness of 2.1 nm. These values are consistent with previous ellipsometric studies on STO and also with the fact that the adsorbed overlayers decrease in ultrahigh vacuum conditions due to desorption 40,47 .…”
Section: Spectroscopic Ellipsometry and Dielectric Function Extractionsupporting
confidence: 93%
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“…Note that measurements outside the cryostat in ambient conditions result in a thickness of 2.1 nm. These values are consistent with previous ellipsometric studies on STO and also with the fact that the adsorbed overlayers decrease in ultrahigh vacuum conditions due to desorption 40,47 .…”
Section: Spectroscopic Ellipsometry and Dielectric Function Extractionsupporting
confidence: 93%
“…While converting previously reported dielectric function data from Cardona and others 30,36 to refractive index and extinction coefficient, apparently the data was redshifted by ∼200 meV 59 . This mistake was then repeatedly reported by various later authors along with their new results, each explicitly highlighting these discrepancies 5,40,42,47 . We find that the original data by Cardona in fact agree quite well with most subsequent reports.…”
Section: Introductionmentioning
confidence: 83%
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“…The spectra were evaluated by transfer matrix calculations within a layered optical model being STO substrate/NBT film/surface imperfection. The optical constants for the STO substrate were taken from our previous study [9]. The roughness of the surface was approximated by effective medium theory (effective medium approximation EMA) according to Bruggeman [10], assuming 50% of voids in the matrix of NBT.…”
Section: Ellipsometrymentioning
confidence: 99%
“…В данной области энергий точность таких измерений составляет ∼ 0.1−0.01 eV. Полученные экспериментальные результаты для полупроводников [12][13][14][15][16][17][18][19] показывают, что, вследствие перечисленных выше особенностей, спектры оптических функций в области переходов с остовных уровней содержат до восьми-девяти максимумов и ступенек.…”
Section: Introductionunclassified