2015
DOI: 10.1116/1.4935450
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Ultraviolet optical properties of aluminum fluoride thin films deposited by atomic layer deposition

Abstract: Aluminum fluoride (AlF3) is a low refractive index material with promising optical applications for ultraviolet (UV) wavelengths. An atomic layer deposition process using trimethylaluminum and anhydrous hydrogen fluoride has been developed for the deposition of AlF3 at substrate temperatures between 100 and 200 °C. This low temperature process has resulted in thin films with UV-optical properties that have been characterized by ellipsometric and reflection/transmission measurements at wavelengths down to 200 n… Show more

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Cited by 29 publications
(39 citation statements)
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“…In addition, as already mentioned, AlF 3 is a potential artificial SEI-layer for protecting both cathodes and anodes [47,143,145,[165][166][167]. Thus, AlF 3 has become a much studied ALD material in the past few years [143,145,147,149,156]. Magnesium fluoride showed growth rates of 0.6 to 0.3 Å/cycle in the deposition temperature range of 100 to 250 • C (Figure 12a) [148].…”
Section: Ald Of Metal Fluorides Using Hf As the Fluorine Sourcementioning
confidence: 75%
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“…In addition, as already mentioned, AlF 3 is a potential artificial SEI-layer for protecting both cathodes and anodes [47,143,145,[165][166][167]. Thus, AlF 3 has become a much studied ALD material in the past few years [143,145,147,149,156]. Magnesium fluoride showed growth rates of 0.6 to 0.3 Å/cycle in the deposition temperature range of 100 to 250 • C (Figure 12a) [148].…”
Section: Ald Of Metal Fluorides Using Hf As the Fluorine Sourcementioning
confidence: 75%
“…Magnesium fluoride showed growth rates of 0.6 to 0.3 Å/cycle in the deposition temperature range of 100 to 250 • C (Figure 12a) [148]. AlF 3 showed a similar decrease in growth rate, being 1.2 Å/cycle at 100 • C and 0.5 Å/cycle at 200 • C (Figure 12c) [149]. MgF 2 films were crystalline and showed small amounts of carbon and oxygen impurities and a slight fluorine deficiency in XPS measurements (Figure 12d) [148].…”
Section: Ald Of Metal Fluorides Using Hf As the Fluorine Sourcementioning
confidence: 91%
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“…Recent research at JPL has led to the development of several ALD processes for metal fluorides using anhydrous HF as the fluorine-containing precursor. 17,18 The simplicity of this ALD chemistry has enabled the demonstration of the metal fluoride ALD processes indicated in Table 1 at temperature as low as 100 °C, and with reduced impurity concentration and superior UV optical properties. These developments have been employed at JPL in the fabrication of protected aluminum mirrors with coatings of ALD MgF 2 , AlF 3 , and LiF films.…”
Section: Atomic Layer Deposition Process Developmentmentioning
confidence: 99%