2016
DOI: 10.1002/pip.2762
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Ultrathin PECVD epitaxial Si solar cells on glass via low-temperature transfer process

Abstract: International audienc

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Cited by 32 publications
(33 citation statements)
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“…We consider c-Si solar cells with Gaussian roughness for light trapping, focusing on the thickness dependence of the figures of merit and on the effect of extrinsic recombination. Our main goal is to understand realistic efficiency limits and prospects for thin-film c-Si solar cells produced with non-waferbased techniques like layer transfer or liquid-phase recrystallization [90][91][92][93][94][95], which are needed for thicknesses below the wafer limit of~80 µm.…”
Section: Electro-optical Modeling For Thin-film Silicon Solar Cellsmentioning
confidence: 99%
“…We consider c-Si solar cells with Gaussian roughness for light trapping, focusing on the thickness dependence of the figures of merit and on the effect of extrinsic recombination. Our main goal is to understand realistic efficiency limits and prospects for thin-film c-Si solar cells produced with non-waferbased techniques like layer transfer or liquid-phase recrystallization [90][91][92][93][94][95], which are needed for thicknesses below the wafer limit of~80 µm.…”
Section: Electro-optical Modeling For Thin-film Silicon Solar Cellsmentioning
confidence: 99%
“…[2][3][4] To produce thin c-Si cells without excessive material waste, new manufacturing technologies have been recently developed, including silicon epitaxial growth and direct wafering. [5][6][7][8] Despite the cost benefits, the combination of an indirect band gap and thinness of the absorber make thin c-Si cells a poor absorber of near-infrared light, leading to significant photocurrent losses. Therefore, light trapping is paramount for thin c-Si PV cells to approach the Shockley-Queisser limit.…”
Section: Introductionmentioning
confidence: 99%
“…Note that the electrical activity of such crystal defects remains to be determined. But given that this low temperature epi-Si on GaAs material contains a large amount of hydrogen (0.1–1%) 29 , a significant fraction of those defects may be passivated.…”
Section: Resultsmentioning
confidence: 99%