ULTRATHIN Al FILM ON THE W(100) SURFACE

Abstract

We have investigated Al adsorption on the W(100) surface using LEED and low energy Ion Scattering Spectroscopy (ISS). We observe a p(2 × 1) double domain LEED image for the 1.0 ML Al/W(100) surface at annealing temperature 850 • C. We also measured the Al adsorption site at the Al/W(100) -p(2 × 1) surface using ISS. It is found that Al atoms adsorbed at 0.7 ± 0.1Å aside from the center of the bridge sites with a zigzag structure -one atom adsorbs at the right-hand side and next atom at the left-hand side along the [100] direction. The height of the adsorbed Al atoms is determined to be 1.75 ± 0.15Å above the W surface layer. Keywords: Low energy ion scattering; W(100); Al; surface structure; adsorption site. 835 Mod. Phys. Lett. B 2009.23:835-847. Downloaded from www.worldscientific.com by UNIVERSITY OF CALIFORNIA @ DAVIS on 02/08/15. For personal use only.

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