“…It is well known that the susceptibility tends to show different values according to the sample fabrication methods, thickness of the film and analytical methods of characterisation. In Figure 4, we listed several conventional dielectric parameters from popular data sets by Palik, Mcpeak, Olmon, Werner, Yakbousky, Lermarchand, Johnson and Christy [15,16,[18][19][20][21][22]. These parameters show variation in wavelength and spectral shape.…”