2007
DOI: 10.1063/1.2431709
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Ultrathin amorphous Si layer formation by femtosecond laser pulse irradiation

Abstract: Formation of ultrathin amorphized Si layer by femtosecond laser irradiation is reported in this letter. Below the fluence of ablation threshold, femtosecond laser irradiation induced an amorphization of crystalline Si. The authors confirmed the thickness of amorphous Si layer by transmission electron microscope. The thickness of the amorphized layer was found to be quite uniform and did not depend on the number of irradiated laser pulses and fluence, which was related to the effective light penetration depth.

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Cited by 75 publications
(49 citation statements)
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“…Second, the thickness of the amorphous top layer is shallow and an increasing function of pulse number N. This accumulative behavior is quite similar to the well-known effect of a reduction of the ablation threshold for increasing pulse numbers, both being caused by an increase of the absorption coefficient and therefore an enhanced energy deposition during the first pulses. The thickness of laser-induced amorphous layers in Si has been investigated by Izawa et al using transmission electron microscopy performed at sample cross sections 8 . Using the same irradiation wavelength and pulse duration as ours, the authors reported a maximum thickness of 40 nm for N = 20 (the only N value they studied).…”
Section: Textmentioning
confidence: 99%
See 1 more Smart Citation
“…Second, the thickness of the amorphous top layer is shallow and an increasing function of pulse number N. This accumulative behavior is quite similar to the well-known effect of a reduction of the ablation threshold for increasing pulse numbers, both being caused by an increase of the absorption coefficient and therefore an enhanced energy deposition during the first pulses. The thickness of laser-induced amorphous layers in Si has been investigated by Izawa et al using transmission electron microscopy performed at sample cross sections 8 . Using the same irradiation wavelength and pulse duration as ours, the authors reported a maximum thickness of 40 nm for N = 20 (the only N value they studied).…”
Section: Textmentioning
confidence: 99%
“…Lett. 110, 211602 (2017); doi: http://dx.doi.org/10.1063/1.4984110 2 laser pulse duration, wavelength and number of irradiation pulses, as well as film thickness and choice of substrate in the case of thin Si films [5][6][7][8][9][10] . Despite this early discovery, most laser-induced phase-change studies in Si focused on transforming large areas, for instance laser-annealing of amorphous Si for fabrication of solar cells 11,12 or OLED displays 13 .…”
Section: Textmentioning
confidence: 99%
“…It is apparent that the selective gold patterning over a large area was achieved. The processed area is expected to be amorphous silicon since it showed a higher reflectivity than that of the unprocessed area [2]. Both results from different processing tools indicated that gold precipitation with high density can be achieved when amorphous silicon phase was induced with a processing tool.…”
Section: Droppingmentioning
confidence: 68%
“…Furthermore, we showed that amorphous silicon induced by FIB-processing on the crystalline silicon surface played a crucial role in the growth of gold nanoparticles. Since amorphous silicon can also be induced using a pulsed laser [2], gold patterns can be achieved using a laser instead of an FIB.…”
Section: Introductionmentioning
confidence: 99%
“…It is known that the defects and amorphization of Si created by the preceding pulses at a prebreakdown threshold irradiance enhance the generation of free electrons and avalanche ionization [19]. Formation of amorphous silicon (a-Si) was reported for Si irradiated by fs-pulses: 0.18 J/cm 2 at 800 nm [20]. The thickness of a-Si was approximately 42 nm after six laser pulses with no changes in the a ∌ 2 nm thickness of native oxide observed [20].…”
Section: Nonlinear Optical Propertiesmentioning
confidence: 99%